RAS was contracted by the PANY&NJ to develop an obstruction chart for John F. Kennedy International Airport (JFK) and data submission to the Federal Aviation Administration’s (FAA) Airport GIS (AGIS) portal and the Port Authority of NY & NJ (PA) Interactive Airport Layout Plan (iALP) system. The basis for this study was the acquisition of new digital imagery with Airborne GPS/IMU and low-altitude LiDAR data sets in order to develop accurate approach plain obstruction data to be overlaid on digital ortho-photos.The survey information collected during this project will be utilized to develop an obstruction chart for John F. Kennedy International Airport (JFK) and data submission to the Federal Aviation Administration’s (FAA) Airport GIS (AGIS) portal and the Port Authority of NY & NJ (PA) Interactive Airport Layout Plan (iALP) system. It will also be used in the development of United States Standard for Instrument Approach Procedures (TERPS) and One-Engine Inoperative (OEI) surfaces to be utilized in the PA’s iALP system.

 

The PA requires the aeronautical survey to complete obstruction data collection that meets the standards outlined in the FAA Advisory Circulars 150/5300-16A, -17B and -18B. The survey specifications utilized adhere to the requirements for obstruction analysis as per Advisory Circular 150/5300-18B, Chapter 2.6. The imagery analysis will be completed and delivered based on the current as-built positions of the runway.